Polarization Dependent Loss Multimeter High Accuracy/High Speed

SKU: FPDL

The FPDL is a high-accuracy, ultra-fast fiber-optic instrument designed for production testing and characterization of silicon photonic devices, including insertion loss (IL) and polarization-dependent loss (PDL). The system is based on a three-electro-optic-crystal polarization controller. For insertion loss measurements, the input polarization is scrambled at an ultra-high speed of 2 MHz, providing accurate polarization-independent measurements. For PDL measurements, the three-crystal polarization controller scans the entire Poincaré sphere at 500 Hz. The IL scrambling mode and PDL scanning mode can be switched via the USB or RS-232 interface. The FPDL is available in three configurations: Pass-through configuration with front-panel input and output optical ports for integration into existing automated test systems. Integrated power meter configuration for high-accuracy PDL measurements with an advanced maximum/minimum search algorithm determines the PDL with an accuracy better than 0.05 dB in less than 2 m. Integrated laser source (optional), including a tunable C-band laser for wavelength-dependent loss (WDL) characterization.
The instrument offers high-speed measurements, a wide dynamic range, a bright display, and analog/digital I/O for easy integration into automated production stations. It operates over a wide wavelength range without requiring wavelength calibration. Standard communication interfaces include USB, Ethernet, GPIB, and RS-232. The FPDL is ideally suited for rapid, accurate characterization of silicon photonic devices, DWDM components, fiber-optic sensors, and other passive optical components in both manufacturing and laboratory environments. Multi-channel systems in a compact 1U rack-mount configuration with Ethernet or RS-232 control are also available.